Abstract
This paper presents two mathematical models. Model I represents a repairable system with two failure modes and one identical standby unit. Similarly, Model II represents a system with one failure mode and one identical standby unit. The state probability equations are developed.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 243-245 |
| Number of pages | 3 |
| Journal | Microelectronics Reliability |
| Volume | 19 |
| Issue number | 3 |
| DOIs | |
| State | Published - 1979 |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Condensed Matter Physics
- Safety, Risk, Reliability and Quality
- Surfaces, Coatings and Films
- Electrical and Electronic Engineering
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