Introduction: Opportunities, artifacts, and interpretation of aberration-corrected electron microscopy data

Research output: Contribution to journal › Editorial › peer-review

Original language	English (US)
Pages (from-to)	651
Number of pages	1
Journal	Microscopy and Microanalysis
Volume	18
Issue number	4
DOIs	https://doi.org/10.1017/S1431927612001493
State	Published - Aug 2012

All Science Journal Classification (ASJC) codes

@article{875e7c10268540d38c95b88f237e68ff,

title = "Introduction: Opportunities, artifacts, and interpretation of aberration-corrected electron microscopy data",

author = "Phil Batson and Dave Smith",

year = "2012",

month = aug,

doi = "10.1017/S1431927612001493",

language = "English (US)",

volume = "18",

pages = "651",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

number = "4",

}

TY - JOUR

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T2 - Opportunities, artifacts, and interpretation of aberration-corrected electron microscopy data

AU - Batson, Phil

AU - Smith, Dave

PY - 2012/8

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U2 - 10.1017/S1431927612001493

DO - 10.1017/S1431927612001493

M3 - Editorial

AN - SCOPUS:84864769097

SN - 1431-9276

VL - 18

SP - 651

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - 4

ER -