Engineering Research Equipment: Combination of ESPI and Tele-Microscopic Systems for Diagnostics in Mechanics of Materials

CMS 9800308 PI: A. Pelegri Rutgers U ABSTRACT An Electronic Speckle Pattern Interferometry system and a Tele-Microscope are acquired to study the onset of intraply delamination, delamination growth in laminated composite structures, evaluation of shear stresses in delaminated composite beams, and assessment of martensite plates orientation during ohase transformation in shape memory alloys. These investigations help in understanding scale effects in testing and damage of composites, developing scale laws such that data generated at subscale level can be used to predict the behavior of full-scale components, and providing insight into damage initiation and phase transformation mechanisms. Application areas include electronic packaging, structronics, aerospace structures, and optical fibers. ***